Distribution of Critical Current Density in a Superconducting Bi-2223 Tape Wire


Title, author, abstract

title
Distribution of Critical Current Density in a Superconducting Bi-2223 Tape Wire
authors
Masaru Kiuchi(1), Akihito Yamasaki(1), Teruo Matsushita(1,2)
Jun Fujikami(3), Kazuya Ohmatsu(3), Ken-ichi Sato(3)
(1)Department of Computer Science and Electronics, Kyushu Institute of Technology,
680--4 Kawazu, Iizuka, 820 JAPAN
(2)Graduate School of Information Science and Electrical Engineering (ISEE), Kyushu University,
6--10--1 Hakozaki, Higashi-ku, Fukuoka 812--81, Japan
(3)Osaka Research Laboratories, Sumitomo Electric Industries, Ltd., 1--1--3 Shimaya,
Konohana-ku, Osaka 544, Japan
abstract
The distribution of pinning strength is estimated from measured current-voltage curves using the Weibull function for a Bi-2223 silver-sheathed tape wire under a magnetic field parallel to the $c$-axis. The obtained result is compared with a simple distribution function assumed in the analysis of the scaling of current-voltage curves using the flux creep-flow model. It is found that the simple distribution function describes well. The wide distribution seems to be caused by percolating current paths due to weak lines.
Original paper appears in
10th International Symposium on Superconductivity
October 28--30, 1997
Gifu, Japan