IRREVERSIBILITY FIELD IN MULTIFILAMENTARY Nb-Ti WIRES WITH FINE FILAMENTS


Title, author, abstract

title
IRREVERSIBILITY FIELD IN MULTIFILAMENTARY Nb-Ti WIRES WITH FINE FILAMENTS
authors
Hiroshi Matsuoka1, Edmund S. Otabe1 Teruo Matsushita1 and Tsugio Hamada2
1 Department of Computer Science and Electronics, Kyushu Institute of Technology,
680--4 Kawazu, Iizuka, 820 JAPAN
2 Department of Electrical Engineering, Miyakonojo College of Technology,
473-1 Yoshio, Miyakonojo, 885 JAPAN
abstract
The irreversibility field of multifilamentary Nb-Ti wires was measured and found to be seriously suppressed due to the flux creep at high temperatures while the critical current density was fairy large. This is explained from the small pinning potential compared with a bulk specimen, since the pinning potential is limited by the size of the filaments. The experimental result is compared with the prediction based on the flux creep theory. Although the degradation of the irreversibility field is theoretically explained by the mechanism of flux creep, there exists a quantitative difference in the vicinity of critical temperature. This difference may come from the inhomogeneities of the superconducting property or the flux pinning strength in the specimens.
Original paper appears in
9th International Symposium on Superconductivity
October 21--25, 1996
Sapporo, Hokkaido, Japan